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Software Reliability Growth Modeling in the Testing Phase with an Outlier Stage
Park Man Gon, Jung Eun Yi The Transactions of the Korea Information Processing Society (1994 ~ 2000),
Vol. 5, No. 10, pp. 2575-2583,
Oct.
1998
10.3745/KIPSTE.1998.5.10.2575
10.3745/KIPSTE.1998.5.10.2575
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Vol. 1, 2012
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